
IEEE 1149.1 (JTAG) workshop: Boundary-Scan Engineering: Unlocking Embedded Testing
June 24 @ 10:30 pm - 11:35 pm CDT
This session introduces the fundamental concepts and practical applications of boundary-scan testing, enabling engineers to efficiently validate, diagnose, and program complex electronic circuits.
Participants will explore how IEEE 1149.1 revolutionizes PCB and IC testing by minimizing physical test points, supporting in-system programming, and enhancing system-level diagnostics.
The workshop highlights how mastering boundary-scan methods ensures design for testability, improves production yields, and simplifies troubleshooting in embedded systems.
PDH certificates will be provided.
Offered by the IEEE Oklahoma City Section as part of the Standard Electrical and Electronic Engineering (SEEE) Workshop Series.
Speaker(s): Reza Kandezy
Room: N0202, Bldg: Sarkeys Energy Center, 100 Boyd St, Norman, Oklahoma, United States, 73019-1102, Virtual: https://events.vtools.ieee.org/m/483202