Week of Events
Explore & Grow: One-on-One Professional Guidance from an IEEE Volunteer
This is a volunteer-led, one-on-one session offered to support your professional and personal growth. Whether you're exploring career direction, enhancing your technical skills, or developing soft skills like communication, leadership, and time management — this session is designed around your unique goals. We’ll also discuss how IEEE resources, communities, and volunteering opportunities can support your development journey — from technical learning to building a strong professional network. These sessions are informal, private, and tailored to your interests. Hosted by an IEEE volunteer as part of our commitment to mentoring and professional development within the technical community. Note: Limited availability. Registration is required. Please do not forward this link publicly. Virtual: https://events.vtools.ieee.org/m/483987
MOVE USA Jun 2025 Tech Talk – Convoy of Hope
MOVE USA Jun 2025 Tech Talk – Convoy of Hope
Convoy of Hope is a faith-based humanitarian organization dedicated to transforming lives in the U.S. and around the world. With a focus on ending generational poverty, Convoy runs impactful programs including children’s feeding initiatives, women’s empowerment efforts, and sustainable agriculture development. Beyond these core programs, Convoy of Hope is a critical first responder when disaster strikes. With a specialized fleet of vehicles and a trained response team, they deliver essential relief supplies to communities hit by natural and humanitarian crises. In 2024 alone, Convoy responded to 99 disasters both domestically and internationally. What sets Convoy’s Disaster Response team apart is their innovative model for serving survivors—something we’ll explore in more detail during the MOVE USA Tech Talk. Co-sponsored by: IEEE-USA MOVE Program Speaker(s): Ethan Forhetz Virtual: https://events.vtools.ieee.org/m/463714
IEEE 1149.1 (JTAG) workshop: Boundary-Scan Engineering: Unlocking Embedded Testing
IEEE 1149.1 (JTAG) workshop: Boundary-Scan Engineering: Unlocking Embedded Testing
This session introduces the fundamental concepts and practical applications of boundary-scan testing, enabling engineers to efficiently validate, diagnose, and program complex electronic circuits. Participants will explore how IEEE 1149.1 revolutionizes PCB and IC testing by minimizing physical test points, supporting in-system programming, and enhancing system-level diagnostics. The workshop highlights how mastering boundary-scan methods ensures design for testability, improves production yields, and simplifies troubleshooting in embedded systems. PDH certificates will be provided. Offered by the IEEE Oklahoma City Section as part of the Standard Electrical and Electronic Engineering (SEEE) Workshop Series. Speaker(s): Reza Kandezy Room: N0202, Bldg: Sarkeys Energy Center, 100 Boyd St, Norman, Oklahoma, United States, 73019-1102, Virtual: https://events.vtools.ieee.org/m/483202
IEEE Kansas City ExCom June 2025 Meeting
IEEE Kansas City ExCom June 2025 Meeting
June 2025 Executive Committee Meeting for the Kansas City Section of IEEE (R50019) Agenda: - Call to Order - Old Business - New Business - Regional Updates - Chapter Updates - Next Meeting - Adjournment Virtual: https://events.vtools.ieee.org/m/486201
Per Unit System Refresher
Per Unit System Refresher
The "Per Unit System Refresher" session is designed to provide a review of the per unit system, a fundamental concept in electrical engineering. This refresher aims to reinforce participants' understanding of base values, conversion methods, and calculations within the per unit framework. By revisiting key principles and exploring practical applications, the session will highlight the advantages of using the per unit system for simplifying complex calculations and ensuring consistency in analysis. Speaker Name: Muhammad Hamid Agenda: AGENDA: - Welcome and Introductions - Review of Per Unit Systems - Revisiting the Fundamentals - Calculation Examples - Q&A Session Room: Lincoln Center 2 Conference Room., Bldg: Suite 400 Dallas,, Two Lincoln Centre, 5420 LBJ Freeway, , Dallas, Texas, United States, TX 75240.
IEEE 1687 (iJTAG) workshop: Inside the Chip: Advanced Embedded Diagnostics
IEEE 1687 (iJTAG) workshop: Inside the Chip: Advanced Embedded Diagnostics
This session explores advanced techniques for embedded instrumentation access, enabling engineers to perform in-depth diagnostics, monitoring, and configuration inside complex integrated circuits. Participants will learn how IEEE 1687 extends traditional JTAG capabilities to internal chip structures, standardizing access protocols and significantly enhancing system-level debug, validation, and maintenance processes. The workshop highlights how mastering iJTAG accelerates testing, improves system observability, and reduces product development cycles in modern electronic design. PDH certificates will be provided. Offered by the IEEE Oklahoma City Section as part of the Standard Electrical and Electronic Engineering (SEEE) Workshop Series. Speaker(s): Reza Kandezy Room: N0202, Bldg: Sarkeys Energy Center, 100 Boyd St, Norman, Oklahoma, United States, 73019-1102, Virtual: https://events.vtools.ieee.org/m/483204